| CVE |
Vendors |
Products |
Updated |
CVSS v3.1 |
| Memory corruption while invoking callback function of AFE from ADSP. |
| Memory corruption in BT controller while parsing debug commands with specific sub-opcodes at HCI interface level. |
| Transient DOS can occur when the driver parses the per STA profile IE and tries to access the EXTN element ID without checking the IE length. |
| Information disclosure in WLAN HAL while handling the WMI state info command. |
| Memory corruption while processing finish_sign command to pass a rsp buffer. |
| Memory corruption in Core while processing RX intent request. |
| Transient DOS may occur while processing the country IE. |
| Memory corruption in Boot while running a ListVars test in UEFI Menu during boot. |
| Information disclosure in WLAN HAL while handling command through WMI interfaces. |
| Memory corruption when resource manager sends the host kernel a reply message with multiple fragments. |
| Memory corruption in TZ Secure OS while requesting a memory allocation from TA region. |
| Memory corruption in HLOS while running playready use-case. |
| Transient DOS in Data Modem during DTLS handshake. |
| Possible use after free when process shell memory is freed using IOCTL call and process initialization is in progress in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables, Snapdragon Wired Infrastructure and Networking |
| Memory corruption in Audio during playback with speaker protection. |
| Information disclosure due to exposure of information while GPU reads the data in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables |
| Information disclosure due to untrusted pointer dereference in kernel in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables |
| Memory corruption in display due to time-of-check time-of-use of metadata reserved size in Snapdragon Auto, Snapdragon Compute, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables |
| Memory corruption during concurrent access to server info object due to incorrect reference count update. |
| Memory corruption may occur during IO configuration processing when the IO port count is invalid. |
